Home
|
Chapter
|
News |
Personalities |
Service |
e-Journal
| History
| Pantheon | Bibliography
Rus /
Eng
|
Contacts |
Forum |
Links |
|
Wayne Nelson
Dr. Wayne Nelson is
a leading expert on reliability and accelerated test data analysis.
He authored two well-known Wiley books "ACCELERATED TESTING" and
"APPLIED LIFE DATA ANALYSIS".
Address:
739 Huntingdon Dr.,
Schenectady, NY
12309,
Phone: (518)
346-5138
e-mail:
WNconsult@aol.com
|
Detailed Information |
Publications |
Hobbies
|
|
|
©
2006 - International Group On
Reliability | Send your correspondence to the Website
hosts: Igor Ushakov &
Alexander Bochkov | Updated:
2007,
August 15 |
|