Michael Pecht
Ph.
Doctor
Director: CALCE Electronic Products
and Systems
George Dieter Chair Professor of
Mechanical Engineering
Professor of Applied Mathematics
(prognostics and health management)
University of Maryland
College Park, Maryland 20742
USA
1+301-405-5323
e-mail:
pecht@calce.umd.edu
www.calce.umd.edu
Michael
Pecht, Visiting Professor in Electronics Engineering City University
of Hong Kong, and Director CALCE Electronics Products and Systems
Center – University of Maryland - USA
Prof
Michael Pecht is currently visiting Professor in Electronics
Engineering at City University of Hong Kong. He has an MS in
Electrical Engineering and an MS and PhD in Engineering Mechanics
from the University of Wisconsin at Madison. He is a Professional
Engineer, an IEEE Fellow, an ASME Fellow and an IMAPS Fellow. He was
awarded the highest reliability honor, the IEEE Reliability
Societyʼs Lifetime Achievement Award in 2008. He served as chief
editor of the IEEE Transactions on Reliability for eight years and
on the advisory board of IEEE Spectrum. He is chief editor for
Microelectronics Reliability and an associate editor for the IEEE
Transactions on Components and Packaging Technology. He is the
founder of CALCE (Center for Advanced Life Cycle Engineering) at the
University of Maryland, College Park, where he is also the George
Dieter Chair Professor in Mechanical Engineering and a Professor in
Applied Mathematics.
He has
written more than twenty books on electronic products development,
use and supply chain management and over 400 technical articles. He
has been leading a research team in the area of prognostics for the
past ten years. He has consulted for over 100 major international
electronics companies, providing expertise in strategic planning,
design, test, prognostics, IP and risk assessment of electronic
products and systems. He has previously received the
European Micro and Nano-Reliability
Award for outstanding contributions to reliability research,
3M
Research Award for electronics packaging, and the IMAPS William D.
Ashman Memorial Achievement Award for his contributions in
electronics reliability analysis.
